Multimode 8 Scanning Probe Microscope (Bruker)

Contact: milab.chemistry [at] mcgill.ca (Mohini Ramkaran) - Location: OM21A

Faces scheduling system group: MU_CHEM_AFM

Documentation - Training - Rates

Scanning Probe Microscopy (SPM) allows for visualisation and measurements based on 3D data and probe-sample interactions of surface structures. Methods, in addition to imaging include but not limited to: mechanical characterization (lateral force, force modulation), electrical (conducting AFM, piezo force) and magnetic.

Features

• Maximum Lateral (X-Y) scan range 100 x 100 μm, Vertical (Z) range 5.0 μm
• Maximum sample size: 15 mm diameter, 5 mm thick
• Noise level: < 0.03 nm RMS in vertical (Z) dimensions
• Operation modes:
• Peak Force Tapping
• ScanAsyst
• Contact Mode AFM
• Tapping Mode AFM
• Phase Imaging
• Non-contact AFM
• Magnetic Force Microscopy (MFM)
• Lateral Force Microscopy (LFM)
• Force Volume
• Scanning Tunneling Microscopy (STM)
• Environmental control: ability to work in fluid, Bioheater (ambient to 60 °C)