CYPHER-S Scanning Probe Microscope (Asylum Research)

Contact: milab.chemistry [at] (Mohini Ramkaran) - Location: PP202

Faces scheduling system group: MU_CHEM_AFM

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Scanning Probe Microscopy (SPM) allows for visualisation and measurements based on 3D data and probe-sample interactions of surface structures. Methods, in addition to imaging include but not limited to: mechanical characterization (lateral force, force modulation), electrical (conducting AFM, piezo force) and magnetic.


  • Maximum Lateral (X-Y) scan range 30 x 30 μm, Vertical (Z) range 5 μm, Closed-loop control
  • Maximum sample size: 15 mm diameter, 7 mm thick
  • Noise level: < 0.05 nm (Z height)
  • Operation modes:
  • Contact Mode
  • AC Mode (Tapping Mode)
  • Phase Imaging
  • Dual AC (bimodal AFM)
  • Force Mode (Contact Mode and AC mode)
  • Lateral Force Mode (LFM)
  • Piezoresponse Force Microscopy (PFM)
  • Magnetic Force Microscopy (MFM)
  • Conductive AFM (cAFM)
  • Scanning Tunneling Microscopy (STM)


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