Because of the coronavirus outbreak, some services are limited.  Facility managers have been communicating details to users as reopening plans are slowly put in place.  Please do not assume that you may use any instrument until you have been told that the instrument is available.  Contact the relevant manager if you have any questions.  Please see the MC2 coronavirus page, the Chemistry Department coronavirus page, or the McGill coronavirus webpage for more information.

MM NSIIIa

Nanoscope Multimode Scanning Probe Microscope (Veeco)


Contact: milab.chemistry [at] mcgill.ca (Mohini Ramkaran) - Location: PP202

Faces scheduling system group: MU_CHEM_AFM

DocumentationTraining - Rates


Scanning Probe Microscopy (SPM) allows for visualisation and measurements based on 3D data and probe-sample interactions of surface structures. Methods, in addition to imaging include but not limited to: mechanical characterization (lateral force, force modulation), electrical (conducting AFM, piezo force), magnetic, optical (near field Raman, IR).

Features

  • Maximum Lateral (X-Y) scan range 100 x 100 μm, Vertical (Z) range 5.0 μm
  • Maximum sample size: 15 mm diameter, 5 mm thick
  • Noise level: < 0.03 nm (Z height)
  • Operation modes:
  • Contact Mode AFM
  • Tapping Mode AFM
  • Phase Imaging
  • Non-contact AFM
  • Magnetic Force Microscopy (MFM)
  • Lateral Force Microscopy (LFM)
  • Scanning Tunneling Microscopy (STM)
  • Environmental control: ability to work in fluid
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