Nanoscope Multimode Scanning Probe Microscope (Veeco)

Contact: milab.chemistry [at] (Mohini Ramkaran) - Location: PP202

Faces scheduling system group: MU_CHEM_AFM

DocumentationTraining - Rates

Scanning Probe Microscopy (SPM) allows for visualisation and measurements based on 3D data and probe-sample interactions of surface structures. Methods, in addition to imaging include but not limited to: mechanical characterization (lateral force, force modulation), electrical (conducting AFM, piezo force), magnetic, optical (near field Raman, IR).


  • Maximum Lateral (X-Y) scan range 100 x 100 μm, Vertical (Z) range 5.0 μm
  • Maximum sample size: 15 mm diameter, 5 mm thick
  • Noise level: < 0.03 nm (Z height)
  • Operation modes:
  • Contact Mode AFM
  • Tapping Mode AFM
  • Phase Imaging
  • Non-contact AFM
  • Magnetic Force Microscopy (MFM)
  • Lateral Force Microscopy (LFM)
  • Scanning Tunneling Microscopy (STM)
  • Environmental control: ability to work in fluid