MFP-3D Stand Alone AFM (Asylum Research)

Contact: milab.chemistry [at] mcgill.ca (Mohini Ramkaran) - Location: OM21A

Faces scheduling system group: MU_CHEM_AFM

Documentation - Training - Rates

Scanning Probe Microscopy (SPM) allows for visualisation and measurements based on 3D data and probe-sample interactions of surface structures. Methods, in addition to imaging include but not limited to: mechanical characterization (lateral force, force modulation), electrical (conducting AFM, piezo force).

Features

• Maximum Lateral (X-Y) scan range 90 x 90 μm, Vertical (Z) range 40 μm, Closed-loop control
• Maximum sample size: 86 mm x 38 mm, 5mm thick
• Noise level: < 0.06 nm (Z height)
• Operation modes:
• Contact Mode
• AC Mode (Tapping Mode)
• Phase Imaging
• Force Mode (Contact Mode and AC mode)
• Lateral Force Mode (LFM)
• Environmental control:
• iDrive Fluid imaging
• Closed fluid cell (allows for fluid exchange)
• Bioheater (ambient to 80 °C)
• Humidity sensing cell