Because of the coronavirus outbreak, some services are limited.  Facility managers have been communicating details to users as reopening plans are slowly put in place.  Please do not assume that you may use any instrument until you have been told that the instrument is available.  Contact the relevant manager if you have any questions.  Please see the MC2 coronavirus page, the Chemistry Department coronavirus page, or the McGill coronavirus webpage for more information.


MFP-3D Stand Alone AFM (Asylum Research)

Contact: milab.chemistry [at] (Mohini Ramkaran) - Location: OM21A

Faces scheduling system group: MU_CHEM_AFM

DocumentationTraining - Rates

Scanning Probe Microscopy (SPM) allows for visualisation and measurements based on 3D data and probe-sample interactions of surface structures. Methods, in addition to imaging include but not limited to: mechanical characterization (lateral force, force modulation), electrical (conducting AFM, piezo force), magnetic, optical (near field Raman, IR).


  • Maximum Lateral (X-Y) scan range 90 x 90 μm, Vertical (Z) range 40 μm, Closed-loop control
  • Maximum sample size: 86 mm x 38 mm, 5mm thick
  • Noise level: < 0.06 nm (Z height)
  • Operation modes:
  • Contact Mode
  • AC Mode (Tapping Mode)
  • Phase Imaging
  • Force Mode (Contact Mode and AC mode)
  • Lateral Force Mode (LFM)
  • Environmental control:
  • iDrive Fluid imaging
  • Closed fluid cell (allows for fluid exchange)
  • Bioheater (ambient to 80 °C)
  • Humidity sensing cell
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