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Overview
BIEN : Introduction to electron microscopy and 3D imaging. Dual-beam microscopy (FIB-SEM, or focused ion beam – scanning electron microscope); conventional and cryogenic preparation methods for biological materials. Complementary methods such as X-ray diffraction, X-ray tomography, atom probe tomography. 3D image processing and analysis, and the fundamentals of deep learning in imaging.
Terms: Winter 2024
Instructors: Reznikov, Natalie (Winter)
3-3-3
Prerequisite: Permission of the instructor.
Restrictions: Open to undergraduate (U3 or higher) and graduate students. Priority is given to bioengineering U3 undergraduate students.
