The Hitachi FlexSEM1000II scanning electron microscope provides rapid surface imaging and microstructure analysis.
Typical applications include:
- Surface morphology analysis
- Biological sample imaging
- Microstructure analysis of materials
- Quality inspection of micro-scale structres
- Detection and mapping of elements
- Environmental imaging of non dried samples
- Scanning-Transmission electron microscopy
EQUIPMENT FEATURES | SPECIFICATIONS |
|---|---|
| Model | Hitachi FlexSEM1000II |
| Controls | Operation Control Panel |
| Features and Applications | 3-axis motor driven stage ( (X/Y/360°Rotation) Manual Z adjustment Tilt -15° to +90° Accelerating Voltage Range: 0.3kV to 20kV Magnification Range: 6x to 300,000x (image ratio) Tiling STEM holder for brightfield imaging Peltier heating and cooling stage (-25°C to +50°C) Variable pressure imaging (6 to 100Pa) Max sample size: 80mm diameter, 40mm thickness |
| Electron Source | Tungsten filament |
| Detectors | Secondary electron detector Backscattered electron detector (5 segments) Ultra-variable pressure detector (UVD) Energy Dispersive X-Ray Spectroscopy (EDS) |
| Software | FlexSEM 1000 AZtecOne with Xplore Compact 30 |
| Location | R1-009 |
