ISS Surface & Materials Characterization Workshop - May 19 & 20, 2015

Location: Rm. 7130 Wong Building, 3610 University Street - Montreal

Main Instructor: Prof. Pierre-Luc Girard-Lauriault, Department of Chemical Engineering

Co-Instructors: Prof. Raynald Gauvin & Prof. Marta Cerruti, Department of Mining and Materials Engineering

Instructor Biography: Prof. Girard-Lauriault is part of the Plasma Processing Laboratory and conducts research on the development of plasma prepared thin organic coatings aimed at biomedical applications.  During both his doctoral, at École Polytechnique, in Montreal (Canada), and post-doctoral, at the federal institute for materials research and testing, in Berlin (Germany) studies he has used and developed an array of surface analysis techniques to understand the chemistry and morphology of complex plasma polymer surfaces as well as their influences on the interactions with living cells.


The X-ray photoelectron spectroscopy (XPS) machine

The workshop aims at providing the participants with a sufficient understanding of the principles of surface characterization in order for them to be able to prepare a tailored characterization strategy to answer their own research questions. It is divided in two parts:

First, a lecture (4h) that will cover the following points:

-An overview of the field of Surface Characterization and a description of its basic principles and considerations.

-A presentation and comparison of the main surface characterization techniques by focusing on i) technique working principles ii) information obtained iii) important practical experimental considerations iv) usefulness for sensor technologies.

-A more detail presentation of X-Ray Photoelectron Spectroscopy (XPS), Scanning Electron Microscopy (SEM) and Raman Spectroscopy.

Following the lecture, the participants will take part in a practical workshop (1.5 days) where several surface characterization techniques (X-Ray Photoelectron Spectroscopy, Scanning Electron Microscopy, Raman spectroscopy, Surface Plasmon Resonance Spectroscopy and Confocal Microscopy) will be used to analyze relevant samples.

Workshop Summary:

Sensor technologies are often based on physical or chemical processes that occur at a surface/interface.  The capacity to characterize and understand the surface properties of materials is therefore a critical success parameter for the development or refinement of a particular sensor application.  The surface is an elusive entity defined by the first atomic layers of a material, which are generally different than those in the bulk material underneath.  The selective analysis of this thin layer of material is a significant challenge, which defines its own field: Surface and Interface Analysis, a combination of principles, techniques and strategies which allow the gathering of information about the surface of materials. 

Space is limited, therefore ISS graduate students and undergraduates will have priority.  Free spots will be allotted on a first come first serve basis, and all non ISS students will be added to the waitlist.

Cost and Registration:

Deadline to register: May 15, 2015

The cost of the workshop is $280.00 plus taxes.  For all ISS participants who register and show up, the fee will be waived. Cancellations should made at least 24 hours in advance or the participant will be charged the full cost of the workshop. Spots will be allotted on a first come first serve basis.