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Equipment
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Instrument
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Applications
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Location |
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Bruker X-ray Diffraction (XRD) Analysis: D8 DISCOVER
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- High-performance Cu X-ray sources
- X-ray Optics: monochromatic
- Goniometer and Sample Stage: XYZ, 1/4-Cradle
- Sample Alignment and Monitor: Optical/video microscope, laser/video
- 2D Detector: VANTEC-2000, the largest 2Theta and Gamma coverage
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- Enables detailed analysis of any crystalline materials from fundamental research
- Phase identification (Qualitative / Quantitative Analysis)
- Crystal structure determination / Crystalline percentage
- Grazing Incident X-Ray Diffraction (GIXRD)
- Various solid materials in the forms of powder, bulk and film samples
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Wong Building
RM 2060
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X-ray Photoelectron Spectroscopy (XPS): Thermo-Scientific K-Alpha
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- X-ray source: Al Kα micro-focused monochromator; Spot size (30-400 μm)
- Analyzer: 180° double focusing hemispherical analyzer; 128-channel detector
- Charge Compensation: Dual beam source; Ultra-low energy electron beam
- Ion Gun: Energy range 200eV – 3keV
- Sample Handling: 60×60mm sample area; 20mm maximum sample thickness
- Vacuum System: 2 turbomolecular pumps for entry and analysis chambers
- Data System: Avantage data system
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- Surface characterization for a variety of solid materials: metals, oxides, plastics, polymers, semiconductor and microelectronics, nano-engineering, and bio-materials
- No special preparation required for various forms: powders, fibers, coatings, films, bulk materials
- Element identification with the detection limit of 0.05%
- Chemical state (bond) analysis with high resolution scanning
- Depth profile analysis with Ar Ion gun sputtering
- Tilt module for Angle reserved XPS (ARXPS)
 
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WONG BUILDING
RM 1280
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Bruker High Resolution Micro-Computed Tomography (microCT): Skysan1172
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- X-ray source: 20-100kV,10W, <5 µm spot size
- Detail detectability: 0.5 µm at highest resolution
- X-ray detector: 11Mp, 12-bit cooled CCD fiber-optically coupled to scintillator
- Maximum object size: 27mm in diameter (single scan) or 50mm in diameter (offset scan)
- Continuous scanning for long objects with 70mm maximum in length
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- Used for life science research, clinical research, material research (metals, polymers & plastics, ceramics, composites, etc.)
- Allow to cut virtual sections or even fly through samples non-destructively
- 2D/3D image analysis and realistic visualization of an object's internal microstructure - microtomography or micro-CT
- No special preparation, coating or vacuum treatment is needed for samples
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WONG BUILDING
RM 2060
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Sem Vega 3
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- VEGA3 has a wide variety of ports, a choice of up to 4 different chamber sizes and optimized geometry for EDX, WDX and EBSD, including multiple detector systems.
- Robust stage with maximum sample weight bearing up to 8 Kg depending on the chamber configuration.
- The extended low-vacuum mode allows imaging on non-conductive samples including biological specimens.
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- High resolution and large depth of focus are the main functions which make scanning electron microscope (SEM) a great tool for observing topographic features of samples made of steel and metal alloys.
- TESCAN SEM systems are ideal instruments for the characterization of biomaterials with high resolution. Wide Field Optics™ allows easy navigation on the sample at very low magnification in real time.
 
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Rutherford Physics Building
Litho room
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