Hitachi TM3030PLUS Table Top Electron Microscope


The Hitachi High-Technologies TM series is pioneering the future of tabletop SEM. This system is compact enough to fit on top of a desk and as easy to operate as a digital camera.
 

Features:

  • Low-vacuum secondary electron detector
  • 15-60,000X magnification
  • No alignment necessary
  • 3D view software
  • Quick X-ray analysis with wide detection area (30mm squared)
  • Point/Area analysis, line scan, and element mapping
     

 

Additional Feature

Our SEM is equipped with a Deben 200N tensile stage that allows the observation of the high stress region in real time. Note that the tensile stage is a standard version without any heating or cooling options. 

For details, visit: 

https://deben.co.uk/tensile-testing/sem/mini-tensile-tester-200n-compres...

 

Fee structure

Academic: $20/hour, Non-Academic: $35/hour

Training/Technical Support: $50/h

Training is required to access the SEM. It includes basic machine features and proper usage and usually takes 1-3 hours. To request a consultation or training contact susanne.kaitna [at] mcgill.ca

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