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UID:20260403T183552EDT-0032UZOOGC@132.216.98.100
DTSTAMP:20260403T223552Z
DESCRIPTION:Instructors\nMain Instructor: Prof. Pierre-Luc Girard-Lauriault
 \, Department of Chemical Engineering\nCo-Instructors: Prof. Raynald Gauvi
 n and Prof. Marta Cerruti\, Department of Mining and Materials Engineering
 \nInstructor Biography: Prof. Girard-Lauriault is part of the Plasma Proce
 ssing Laboratory and conducts research on the development of plasma prepar
 ed thin organic coatings aimed at biomedical applications.  During both hi
 s doctoral\, at École Polytechnique\, in Montreal (Canada)\, and post-doct
 oral\, at the federal institute for materials research and testing\, in Be
 rlin (Germany) studies he has used and developed an array of surface analy
 sis techniques to understand the chemistry and morphology of complex plasm
 a polymer surfaces as well as their influences on the interactions with li
 ving cells.\n \nWorkshop Schedule\nThe workshop aims at providing the part
 icipants with a sufficient understanding of the principles of surface char
 acterization in order for them to be able to prepare a tailored characteri
 zation strategy to answer their own research questions. It is divided in t
 wo parts:\nFirst\, a lecture (4h) that will cover the following points:\n
 \n	An overview of the field of Surface Characterization and a description o
 f its basic principles and considerations.\n	A presentation and comparison 
 of the main surface characterization techniques by focusing on i) techniqu
 e working principles ii) information obtained iii) important practical exp
 erimental considerations iv) usefulness for sensor technologies.\n	A more d
 etail presentation of X-Ray Photoelectron Spectroscopy (XPS)\, Scanning El
 ectron Microscopy (SEM) and Raman Spectroscopy.\n\nFollowing the lecture\,
  the participants will take part in a practical workshop (1.5 days) where 
 several surface characterization techniques (X-Ray Photoelectron Spectrosc
 opy\, Scanning Electron Microscopy\, Raman spectroscopy\, Surface Plasmon 
 Resonance Spectroscopy and Confocal Microscopy) will be used to analyze re
 levant samples.\n \nWorkshop Summary\nSensor technologies are often based 
 on physical or chemical processes that occur at a surface/interface.  The 
 capacity to characterize and understand the surface properties of material
 s is therefore a critical success parameter for the development or refinem
 ent of a particular sensor application.  The surface is an elusive entity 
 defined by the first atomic layers of a material\, which are generally dif
 ferent than those in the bulk material underneath.  The selective analysis
  of this thin layer of material is a significant challenge\, which defines
  its own field: Surface and Interface Analysis\, a combination of principl
 es\, techniques and strategies which allow the gathering of information ab
 out the surface of materials.\nSpace is limited\, therefore ISS graduate s
 tudents and undergraduates will have priority.  Free spots will be allotte
 d on a first come first serve basis\, and all non ISS students will be add
 ed to the waitlist.\n \nCost and Registration\nDeadline to register: May 1
 5\, 2015\nThe cost of the workshop is $280.00 plus taxes.  For all ISS par
 ticipants who register and show up\, the fee will be waived. Cancellations
  should made at least 24 hours in advance or the participant will be charg
 ed the full cost of the workshop. Spots will be allotted on a first come f
 irst serve basis.\n\n	To register\, click here\n
DTSTART:20150519T130000Z
DTEND:20150520T210000Z
LOCATION:3610 University Street\, Wong Building\, CA\, QC\, Montreal\, H3A 
 0C5\, 3610 rue University
SUMMARY:ISS Surface & Materials Characterization Workshop
URL:https://www.mcgill.ca/miam/channels/event/iss-surface-materials-charact
 erization-workshop-243764
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