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Register for the 2015 ISS Surface and Materials Characterization Workshop

To register:

1. Please complete the pre-registration survey below to assess your level and interest.

2. Complete the registration here.

 

The cost of the 2015 workshop is $280.00 plus taxes.  Participants may pay via credit card or FOAPAL at the link provided. For all ISS participants who register and show up, the fee will be waived. Cancellations should be made at least 24 hours in advance or the participant will be charged the full cost of the workshop.

 

Pre-Registration Survey:

 

Personal Information
Please enter an email address at which you can be reached. Official school email address prefered
Given-name, Family-name
Please enter your official school ID number
PLease indicate your current or most recent degree.
Academic Background
Please select all that apply regarding your academic background.
Theoretical Knowledge
On a scale of 1 to 10, 10 being expert knowledge and 1 being no knowledge; evaluate your theoretical knowledge of the following topics and techniques:
12345678910
1) Surface Characterization
2) Surface Chemistry
3) Sensor technologies sensortech
4) X-Ray Photoelectron Spectroscopy (XPS)
5) Scanning Electron Microscopy (SEM)
6) Energy-dispersive X-ray spectroscopy (EDX)
7) Auger Electron Spectroscopy (AES)
8) Atomic Force Microscopy (AFM)
9) Raman Spectroscopy
10) Fourier Transform Infra-Red Spectroscopy (FT-IR)
11) Contact Angle Goniometry
12) Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
13) Ellipsometry
14) Rutherford Backscattering
15) Medium Energy Ion Scattering (MEIS)
16) Low Energy Ion Scattering (LEIS)
17) Near-Edge X-Ray Absorption Fine Structure (NEXAFS)
Practical Knowledge
On a scale of 1 to 10, 10 being expert knowledge and 1 being no knowledge; evaluate your practical knowledge of the following topics and techniques:
12345678910
1) Surface Characterization
2) Surface Chemistry
3) Sensor technologies sensortech
4) X-Ray Photoelectron Spectroscopy (XPS)
5) Scanning Electron Microscopy (SEM)
6) Energy-dispersive X-ray spectroscopy (EDX)
7) Auger Electron Spectroscopy (AES)
8) Atomic Force Microscopy (AFM)
9) Raman Spectroscopy
10) Fourier Transform Infra-Red Spectroscopy (FT-IR)
11) Contact Angle Goniometry
12) Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
13) Ellipsometry
14) Rutherford Backscattering
15) Medium Energy Ion Scattering (MEIS)
16) Low Energy Ion Scattering (LEIS)
17) Near-Edge X-Ray Absorption Fine Structure (NEXAFS)
Q2 : Which of the techniques listed above are you most interested to hear about?
Q3: Is there any other specific topic that you would like to hear about?
Q4 : What are your expectations for this workshop?
If you are an ISS student and there is a reason why your registration for this session should be prioritized, please describe this below (e.g. approaching graduation, need for current project). In the event of over subscription students whose Program Plans list attendance for this year or with a described need will be given priority.
Do you have proof of training in Workplace Hazardous Materials Information System (WHMIS) Training for Laboratory Personnel (Mandatory) in the past 3 years? All students who have not taken the training or who do not have proof will be required to listen to an online class, and to attend a scheduled knowledge assessment (quiz) on the class content at McGill before the workshop.

The ISS Training Program is funded in part by Funded in part by the National Science & Engineering Research Council of Canada and by the Participating Universities:  

  Training program activities hosted by McGill University     ISS hosted in concert with Universite de Sherbrooke          ISS hosted in concert with Ecole Polytechnique       ISS hosted in concert with INRS