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UID:20240418T080828EDT-6147txvpnb@132.216.177.157
DTSTAMP:20240418T120828Z
DESCRIPTION:Workshop Summary: \n\nSensor technologies are often based on ph
 ysical or chemical processes that occur at a surface/interface.  The capac
 ity to characterize and understand the surface properties of materials is 
 therefore a critical success parameter for the development or refinement o
 f a particular sensor application.  The surface is an elusive entity defin
 ed by the first atomic layers of a material\, which are generally differen
 t than those in the bulk material underneath.  The selective analysis of t
 his thin layer of material is a significant challenge\, which defines its 
 own field: Surface and Interface Analysis\, a combination of principles\, 
 techniques and strategies which allow the gathering of information about t
 he surface of materials.  \nSpace is limited\, therefore ISS graduate stud
 ents and undergraduates will have priority.  Free spots will be allotted o
 n a first come first serve basis\, and all non ISS students will be added 
 to the waitlist.\n To register: click HERE
DTSTART;VALUE=DATE:20130620
DTEND;VALUE=DATE:20130621
SUMMARY:2013 ISS Surface & Materials Characterization Workshop 
URL:https://www.mcgill.ca/channels/event/2013-iss-surface-materials-charact
 erization-workshop-227061
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