Guest Speaker - Dr. Thomas F. Kelly, CAMECA

Thomas F. Kelly received his Bachelor of Science in Mechanical Engineering with highest honors from Northeastern University in June 1977. He then entered graduate school at the Massachusetts Institute of Technology and received a Ph.D. in Materials Science in December 1981. After one year as a postdoctoral associate at M.I.T., he joined the faculty of the Department of Metallurgical and Mineral Engineering of the University of Wisconsin-Madison in January 1983. He was a Full Professor from 1994 until his departure in 2001 from the renamed Department of Materials Science and Engineering. Tom was also Director of the Materials Science Center from 1992 to 1999.

While serving as a professor of Materials Science and Engineering in the University of Wisconsin-Madison College of Engineering until September 2001, Tom Kelly founded Imago Scientific Instruments to commercialize atom-probe microscopy-a technology that enables researchers to analyze materials at the atomic scale. His invention, the Local Electrode Atom Probe, or LEAP, captures a three-dimensional atom-by-atom "image" of a material and renders that image on a computer screen.
Tom Kelly has been active in the fields of analytical electron microscopy, atom probe microscopy, rapidly solidified materials, and electronic and superconducting materials for over 35 years. He has published over 240 papers and 16 patents in these fields in that time. Dr. Kelly is an authority on microstructural characterization. He is expert in most forms of transmission electron microscopy, scanning electron microscopy, and atom probe microscopy and has brought innovations to the instrumentation and practice.

Tom was a member of the executive council of the Microscopy Society of America from 2000 to 2002, the International Steering Committee of the International Field Emission Society from 2002 to 2008 and President of the International Field Emission Society from 2006 to 2008. He has served as the inaugural chair of the Microscopy Today Innovation Awards Committee for the Microscopy Society of America since 2010. Tom is also an Editor of Microscopy and Microanalysis and on the Editorial Board of Microscopy Today. From 2010 to 2012, Tom served on the Council of the Microanalysis Society. In 2012 he was elected President Elect of the Microanalysis Society and is serving as President from August 2014 to August 2016.
Tom has driven the innovation in instrumentation for atom probe tomography over the past two decades. He continues to pursue innovations such as pushing microscopy all the way to atomic-scale tomography by developing new detector technologies and combining atom probe tomography with electron microscopy in a single instrument.