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2013 ISS Surface & Materials Characterization Workshop


20 Jun 2013
21 Jun 2013

Workshop Summary:

Sensor technologies are often based on physical or chemical processes that occur at a surface/interface.  The capacity to characterize and understand the surface properties of materials is therefore a critical success parameter for the development or refinement of a particular sensor application.  The surface is an elusive entity defined by the first atomic layers of a material, which are generally different than those in the bulk material underneath.  The selective analysis of this thin layer of material is a significant challenge, which defines its own field: Surface and Interface Analysis, a combination of principles, techniques and strategies which allow the gathering of information about the surface of materials. 

Space is limited, therefore ISS graduate students and undergraduates will have priority.  Free spots will be allotted on a first come first serve basis, and all non ISS students will be added to the waitlist.

 To register: click HERE

Source Site: /miam
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