ECSE 649 VLSI Testing (4 credits)

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Offered by: Electrical & Computer Engr (Faculty of Engineering)

Administered by: Graduate Studies


Electrical Engineering : The course is to orient designers of VLSI chips and boards to think about testing problems in parallel with the design process. Consideration in structured design-for-testability as a requirement for complex systems will be emphasized; as well as the emerging concept of built-in self-test (BIST).

Terms: Winter 2013

Instructors: Zeljko Zilic (Winter)

  • (3-0-9)

  • Prerequisite: B.Eng. or equivalent.