Scanning Electron Microscopy

Scanning Electron Microscopy McGill University

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Scanning Electron Microscopy

Including basic sample preparation, fractography, back scattered imaging, photomicrography, image analysis

Images can be recorded on photographic film, or on diskette, zip-disk or CD

X-ray microanalysis (including light element analysis), X-ray mapping, linescans. For suitable samples, quantitative chemical analysis is possible

Next: Specialized Tests

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Department of Mining and Materials Engineering [Unit detail]
Mining Engineering
Rm 125, Adams Bldg, 3450 University St.
Montreal, QC H3A 2A7

Materials Engineering
Rm 2140, Wong Bldg, 3610 University St.
Montreal, QC H3A 2B2

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McGill University

Page last updated:
Nov. 30, 2007 at 2:57 PM