Schedule:
10:00 a. m. to 6:00 p.m.
Location:
MIAM office - Rm 6A - Frank Dawson Adams Bldg - Conference Office
Instructor:
Louis Forest, Ing. / Eng., M.Sc.A.
Ingénieur en Photolithographie / Photo Engineer
Développement des technologies de fabrication / Microfabrication technology development
Teledyne DALSA Semiconducteur
 |
Louis Forest graduated from Polytechnique de Montréal in 2005 (B.Ing) and 2008 (M.Sc.A.) in Physics Engineering. He then joined DALSA, now Teledyne-DALSA in Bromont, QC, where he worked in the Photolithography group on CCD Yield improvement until 2010. Later, M. Forest joined Teledyne-DASLA's R&D group to work on the introduction of new products as a metrology specialist. |
Going from a sensor concept to prototype and then to production requires a large amount of time and capital investment. The sensor’s technological relevance is strongly Time to Market dependent and reducing the time from idea to marketable device is the key to its success.
Having a process control plan, for which Statistical Process Control holds a central place, is integral to reducing that time. When incorporated in the development phase of the product, the control plan can greatly accelerate performance optimization and rapid yield learning.
Goals
-
Design robust Control and efficient Plans
-
Select Optimized SPC Charts
-
Elaborate Out of Control Action Plans
-
Quantitatively evaluate Process Capacity
-
Quantitatively evaluate metrology capability in a process
-
Help pass a production context interview
The seminar outline
-
Introduction
-
Statistical Process Control
-
Process Capability
-
Metrology
-
Advanced Process Control
-
Conclusions
Cost and Conditions
The cost of the workshop is $100.00 + Taxes.
All students should be prepared to complete a project description of their current research project during registration.
Registration Closing date: 5:00 p.m., Friday, August 21, 2015